New 2 Million Samples/second bender element system

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23/01/2012

Error, Accuracy and Resolution explained, new white paper available for download

Indian Geotechnical Conference

18/12/2011

GDS present a paper and exhibit at the Geochallenges conference in Kochi.

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News February 2007

New 2 Million Samples/second bender element system
		New Features at a glance: 2 Million samples/second per channel Simultaneous acquisition of each channel USB plug and play interface The GDS Bender element testing system can provide both vertical and horizontally S and P-wave tests. For full details of the GDS Bender Element System click here...


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